Showing results: 1606 - 1620 of 2684 items found.
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KS8400A -
Keysight Technologies
The Keysight KS8400A Test Automation Platform (TAP) Developer's System provides powerful, flexible and extensible test sequence and test plan creation with additional capabilities that optimize your test software development and overall performance. Keysight TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher-level test executive software environments. Leveraging C# and the power of Microsoft Visual Studio, TAP is not just another programming language. It's a platform upon which you can build your test solutions, maximizing your team's productivity by using your existing software development tools and infrastructure.
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Saluki Technology Inc.
The new SEL7 series programmable DC electronic load is a new generation product designed by Saluki Technology. Incorporating high-performance chips, the SEL7 series delivers high speed and high accuracy with a resolution of 0.1mV and 0.01mA (basic accuracy is 0.03% and basic current rise speed is 2.5 A/μs).SEL7 series have wide application from production lines for cell phone chargers, cell phone batteries, electronic vehicle batteries, switching power supplies, linear power supplies, and LED drivers, to research institute, automotive electronic, aeronautic and astronautic, maritime, solar cell and fuel cell etc. test and measurement applications.
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DAST -
Veracode
Identify and Fix Critical Runtime Vulnerabilities in Web Applications and APIs.* Identify Vulnerabilities in Runtime Environments. Simultaneously scan hundreds of web apps and APIs to find vulnerabilities quickly - including pre-production and staging environments behind a firewall.*Prioritize and Fix Flaws Quickly, A <5% false positive rate allows teams to focus on the vulnerabilities that matter. Detailed, actionable remediation guidance means flaws are fixed faster.*Contribute to a Successful DevSecOps ProgramDynamic scans can be viewed in the Veracode Platform alongside other application security tests, providing multi-faceted insights into the entire security program. Insights and analytics can be used to further improve your DevSecOps program.
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QCP-1553 Series -
Marvin Test Solutions, Inc.
The QCP-1553 module is a rugged, reliable, full featured, Compact PCI module designed to provide a stand-alone, MIL-STD-1553A/B interface for avionics applications. Up to four independent dual redundant MIL-STD-1553 databus streams are supported by the 3U QCP-1553 module. Additionally, the module offers full functional test, simulation, monitoring and databus analyzer functions for MILSTD-1553A/B applications. An onboard IRIG-B time code decoder and generator allows users to accurately synchronize single or multiple QCP-1553 modules to a common time source. The QCP-1553 module is available in dual or full function (RT simulation, monitoring, and bus controller) configurations.
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779085-01 -
NI
The PCI-6519 is an industrial digital I/O interface, with two banks optically isolated channels. The device is ideal for industrial control and manufacturing test applications. The PCI-6519 module is an industrial digital I/O interface, with eight banks of isolated channels. You can wire each input bank in a source or sink configuration. With programmable power-up states, you can configure the initial output states in software, to ensure safe operation when connected to industrial actuators. If a computer or application fault occurs, the PCI-6519 can use digital I/O watchdogs to switch to a configurable safe output state to ensure detection and safe recovery from fault conditions.
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SMX-7XXX (Microwave) -
AMETEK VTI Instruments
The AMETEK VTI Instruments SMX-7000 Series of microwave switch cards extends functionality typically reserved for dedicated stand-alone systems into the PXIe from-factor. Single and dual slot configurations provide the ability to mix and match multiple switch configurations including SPDT, SP4T, SP6T and Transfer. Embedded virtual schematic control further simplifies setup and debugging allowing all relays to be engaged independent of application software and device drivers. Ideally suited for medium-to-high density automated test equipment (ATE), the SMX-7000 Series deliver uncompromised measurement integrity ideal for the most demanding aerospace, defense and communication applications.
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S930907B -
Keysight Technologies
The S930907B spectrum analysis (SA) adds high-performance microwave spectrum analysis to the N522xB/N524xB PNA family up to 70 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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S930902B -
Keysight Technologies
The S930902B spectrum analysis adds high-performance microwave spectrum analysis to the PNA family up to 26.5 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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781215-01 -
NI
The PXIe‑5650 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5650 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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779670-00 -
NI
The PXI‑5650 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5650 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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779084-01 -
NI
The PCI-6518 is an industrial digital I/O interface, with two banks optically isolated channels. The device is ideal for industrial control and manufacturing test applications. The PCI-6518 module is an industrial digital I/O interface, with eight banks of isolated channels. You can wire each input bank in a source or sink configuration. With programmable power-up states, you can configure the initial output states in software, to ensure safe operation when connected to industrial actuators. If a computer or application fault occurs, the PCI-6518 can use digital I/O watchdogs to switch to a configurable safe output state to ensure detection and safe recovery from fault conditions.
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S930901B -
Keysight Technologies
The S930901B spectrum analysis adds high-performance microwave spectrum analysis to the PNA family up to 13.5 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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EMCTEST
Over the past several decades, RCs have been enjoying growing popularity as a promising facility for the characterization of wireless devices and for EMC testing. The RC (Reverberation Chamber) measurement method exhibits much competitive superiority over the AC (Anechoic Chamber) method and TEM Cell method, such as low cost, enhanced test repeatability, a more realistic test environment, and easily achieved high-field environment. The application of the RC for performing EMC testing was first proposed by H. A. Mendes in 1968. In the recent IEC 61000-4-21 standard, the importance of EMC testing using RCs as an alternative measurement technique has been recognized.
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ARINC 664 -
Avionics Interface Technologies
AIT’s ARINC 664 test instruments can be used in test and simulation applications that are required to transmit and receive data over the ARINC 664 avionics databus. AIT’s instruments use small form-factor pluggable transceivers (SFP) and support copper or fiber optic physical network interfaces.Using an FPGA based architecture, with multiple embedded processors, the ARINC 664 instruments provide onboard support for upper layer protocol processing (A653, UDP, IP) and utilize DMA to provide optimal data throughput. All ARINC 664 protocol operations, including VL traffic shaping, redundancy management, and IP fragmentation and reassembly, are handled onboard.
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72-7265 CAL D -
Tenma
The 72-7265 CAL D from Tenma is a capacitance decade box. It is ideal for service, prototype and experimental use. This useful tool may be set at any non polarized capacitor value from 100pF to 11,111µF in 100pF increments. The decade accuracy is ±5% capacitors used throughout at <1μF, 1KHz test frequency, ≥1μF, 100Hz test frequency. It has weight of 304g/0.69lb and dimension is 14.7cm × 11.7cm × 5.5cm (5.79" × 4.61" × 2.16"). It is typically used in general applications, troubleshooting, maintenance, education and vocational training, production line testing, radio and TV services, working standards, research design & develop, physics laboratory work.
